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Anzahl der Treffer (Daten werden monatlich aktualisiert): 47646

GB/T 35005-2018

Test methods for flip chip integrated circuits

GB/T 35010.7-2018

Semiconductor die products—Part 7: XML schema for data exchange

GB/T 35011-2018

Microwave circuits—Measuring methods for voltage controlled oscillater

GB/T 35010.1-2018

Semiconductor die products—Part 1:Requirements for procurement and use

GB/T 14028-2018

Semiconductor integrated circuits—Measuring method of analogue switch

GB/T 36075.3-2018

Acoustics—Measurement of room acoustic parameters—Part 3: Open plan offices

GB/T 36071-2018

Non-destructive testing instruments—technical requirements of X-ray real-time imaging system

GB/T 24369.2-2018

Characterization of gold nanorods—Part 2: Measurement methods for optical properties

GB/T 22157-2018

Acoustics—Specification of test tracks for measuring noise emitted by road vehicles and their tyres

GB/T 21231.1-2018

Acoustics—Measurement of airborne noise emitted and structure-borne vibration induced by small air-moving devices—Part 1: Airborne noise measurement

Anzahl der Treffer (Daten werden monatlich aktualisiert): 47646