News
- 13.05.2019 ISO/TS 19807-2 "Nanotechnologies -- Magnetic nanomaterials -- Part 2: Specification of characteristics and measurements for nanostructured superparamagnetic beads for nucleic acid extraction
- 01.12.2016 Industrie 4.0: Deutsch-Chinesische Zusammenarbeit nimmt Fahrt auf
- 15.11.2016 Deutsch-chinesisches Seminar in Chengdu
Links
- BAM - Bundesanstalt für Materialforschung und -prüfung
- DIN Media - DIN Media GmbH
- BMWK - Bundesministerium für Wirtschaft und Klimschutz
- DIN - Deutsches Institut für Normung
- PTB - Physikalisch-Technische Bundesanstalt
Suche
DIN EN 62379-3
Common control interface for networked digital audio and video products - Part 3: Video (IEC 62379-3:2015); German version EN 62379-3:2015
DIN EN 62379-2
Common control interface for networked digital audio and video products - Part 2: Audio (IEC 62379-2:2008); German version EN 62379-2:2009
DIN EN 62379-1
Common control interface for networked digital audio and video products - Part 1: General (IEC 62379-1:2007); German version EN 62379-1:2007
DIN EN 62376
Maritime navigation and radiocommunication equipment and systems - Electronic chart system (ECS) - Operational and performance requirements, methods of testing and required test results (IEC 62376:2010); English version EN 62376:2011
DIN EN 62369-1
Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz - Part 1: Fields produced by devices used for electronic article surveillance, radio frequency identification and similar systems (IEC 62369-1:2008); German version EN 62369-1:2009
DIN EN 62366-1
Medical devices - Part 1: Application of usability engineering to medical devices (IEC 62366-1:2015 + COR1:2016 + A1:2020); German version EN 62366-1:2015 + AC:2015 + A1:2020
DIN EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007
DIN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
DIN EN IEC 62372
Nuclear instrumentation - Housed scintillators - Test methods of light output and intrinsic resolution (IEC 62372:2021); German version EN IEC 62372:2022
DIN EN 62359
Ultrasonics - Field characterization - Test methods for the determination of thermal and mechanical indices related to medical diagnostic ultrasonic fields (IEC 62359:2010 + Cor.:2011 + A1:2017); German version EN 62359:2011 + A1:2018





